Download Applied Scanning Probe Methods XII: Characterization by Robert H. Eibl (auth.), Bharat Bhushan, Harald Fuchs (eds.) PDF

By Robert H. Eibl (auth.), Bharat Bhushan, Harald Fuchs (eds.)

Crack initiation and development are key matters in terms of the mechanical reliab- ity of microelectronic units and microelectromechanical platforms (MEMS). Es- cially in natural electronics the place exible substrates will play an immense position those concerns becomes of maximum value. it's as a result essential to enhance me- ods which in situ enable the experimental research of floor deformation and fracture methods in skinny layers at a micro and nanometer scale. whereas scanning electron microscopy (SEM) could be used it's also linked to a few significant experimental drawbacks. to begin with if polymers are investigated and they need to be lined with a steel layer because of their ordinarily non-conductive nature. Additi- best friend they could be broken by means of the electron beam of the microscope or the vacuum may well reason outgasing of solvents or evaporation of water and therefore swap fabric homes. in addition, for every kind of fabrics a large amount of expe- psychological attempt is critical to construct a tensile checking out computing device that ts into the chamber. hence, a truly promising replacement to SEM is predicated at the use of an atomic strength microscope (AFM) to monitor in situ floor deformation strategies in the course of straining of a specimen. First steps in the direction of this target have been proven within the Nineties in [1–4] yet none of those techniques actually used to be a microtensile try with pattern thicknesses within the variety of micrometers. To the authors’ wisdom, this used to be proven for the rst time through Hild et al. in [5]. 16.

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287 Contents – Volume VII 21 22 23 24 25 Lotus Effect: Roughness-Induced Superhydrophobicity Michael Nosonovsky, Bharat Bhushan . . . . . . . . 1 Gecko Feet: Natural Attachment Systems for Smart Adhesion Bharat Bhushan, Robert A. Sayer . . . . . . . . . 41 Novel AFM Nanoprobes Horacio D. -H. Kim . . . . 77 Nanoelectromechanical Systems – Experiments and Modeling Horacio D. Espinosa, Changhong Ke . . . . . . . . 135 Application of Atom-resolved Scanning Tunneling Microscopy in Catalysis Research Jeppe Vang Lauritsen, Ronny T.

315 XL Contents – Volume VIII 10 Kelvin Probe Force Microscopy: Recent Advances and Applications Yossi Rosenwaks, Oren Tal, Shimon Saraf, Alex Schwarzman, Eli Lepkifker, Amir Boag . . . . . . . . . . . . 351 11 Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale Štefan Lányi . . . . . . . . . . . . . . . 12 377 Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy Laura Fumagalli, Ignacio Casuso, Giorgio Ferrari, Gabriel Gomila .

351 Contents – Volume X 27 28 29 30 31 32 33 Gecko Feet: Natural Attachment Systems for Smart Adhesion— Mechanism, Modeling, and Development of Bio-Inspired Materials Bharat Bhushan, Robert A. Sayer . . . . . . . . . 1 Carrier Transport in Advanced Semiconductor Materials Filippo Giannazzo, Patrick Fiorenza, Vito Raineri . . . . . 63 Visualization of Fixed Charges Stored in Condensed Matter and Its Application to Memory Technology Yasuo Cho . .

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